Ni/Cr thin film depth profile standard

NA.24

This Standard Reference Material (SRM) is intended primarily for calibrating sputtered depth scales and erosion rates in surface analysis. A unit of SRM 2135c consists of nine alternating metal thin-film layers, five layers of pure chromium and four of pure nickel, on a polished silicon (100) substrate. For more information,please refer to the COA and SDS.

SRM 2135c_cert SRM 2135c _SDS

NIST is a registered trademark of National Institute of Standards and Technology

100

certified reference material

solid

pkg of each

NIST^®

pharmaceutical (small molecule)

11 - Combustible Solids

WGK 3